搜索包含 Symposium on Semiconductor Memory Testing (1973 : Cherry Hill) 的图书 - 暨南大学图书馆

大拱桥--暨南大学学生门户 » 图书馆 » 搜索包含 Symposium on Semiconductor Memory Testing (1973 : Cherry Hill) 的图书(共3724本)

	Language testing 0 索取号：H31/E604 作者：出版社：[s.l : s.n.], 19-		Introductory steps to understanding 0 索取号：H31/E9035 作者：Hill、 L. A. (Leslie Alexander).、出版社：Tokyo : Oxford University Press, 1980.
	Studies in bilingual education 0 索取号：H09-53/E801 作者：Lord、 Robert、 1931-、Tsou、 Ka-yin、 Benjamin.、University of Hong Kong. Language Centre.、International Symposium on Bilingual Education (Hong Kong : 1976).、出版社：Hong Kong : Language Centre, University of Hong Kong, [1977?]		Testing English as a second language 0 索取号：H31/E708 作者：Harris、 David P. (David Payne)、 1925-、出版社：New York : McGraw-Hill, [1969].
	1998 Midwest Symposium on Circuits and Systems : proceedings, August 9-12, 1998, Notre Dame, Indiana 0 索取号：TN7-53/E20071/41 作者：Midwest Symposium on Circuits and Systems (40th : 1998 : Notre Dame、 Indiana)、IEEE Circuits and Systems Society.、出版社：Los Alamitos, CA : IEEE Computer Soicety, c1998.		Proceedings [of the] 42nd Midwest Symposium on Circuits and Systems [electronic resource] : Corbett Center, New Mexico State University, Las Cruces, New Mexico 0 索取号：TN7-53/E20071/42.2 作者：Midwest Symposium on Circuits and Systems (42nd : 1999 : Las Cruces、 N.M.)、Ramírez-Angulo、 Jaime.、IEEE Xplore (Online service)、IEEE Circuits and Systems Society.、出版社：[New York, N.Y.] : Institute of Electrical and Electronics Engineers ; Piscataway, N.J. : IEEE Service Center, c1999.
	Proceedings [of the] 42nd Midwest Symposium on Circuits and Systems [electronic resource] : Corbett Center, New Mexico State University, Las Cruces, New Mexico 0 索取号：TN7-53/E20071/42.1 作者：Midwest Symposium on Circuits and Systems (42nd : 1999 : Las Cruces、 N.M.)、Ramírez-Angulo、 Jaime.、IEEE Xplore (Online service)、IEEE Circuits and Systems Society.、出版社：[New York, N.Y.] : Institute of Electrical and Electronics Engineers ; Piscataway, N.J. : IEEE Service Center, c1999.		Language testing : a critical survey and practical guide 0 索取号：H09/E9020 作者：Baker、 David.、出版社：London : Edward Arnold, c1989.
	Fatigue and fracture mechanics : 30th volume 0 索取号：O346.1-532/E20011/30 作者：National Symposium on Fatigue and Fracture Mechanics (30th : 1998 : St. Louis、 Missouri)、Jerina、 Kenneth L.、Paris、 P. C. (Paul Croce)、 1930-、ASTM Committee E-8 on Fatigue and Fracture.、出版社：West Conshohocken, Pennsylvania : ASTM, c2000.		Ciba Foundation Symposium : Disorders of Language 0 索取号：H018.4/E701 作者：Symposium on Disorders of Language (1963 : London、 England)、De Reuck、 Anthony V. S.、Ciba Foundation.、O'Connor、 Maeve.、出版社：Boston : Little, Brown, 1964.
	Cliffs memory power for exams 0 索取号：G791/E901 作者：Browning、 William G.、出版社：Lincoln, Neb. : Cliffs Notes, c1983.		Medical physics : fourth Mexican symposium, Merida, Yucatan, Mexico, 1-4 March 2000 0 索取号：R-05/E20011/2000 作者：出版社：Melville, N.Y. : American Institute of Physics, 2000.
	Proceedings, 15th annual Symposium on Logic in Computer Science [electronic resource] : June 26-28, 2000, Santa Barbara, California 0 索取号：TP301-53/E991/15 作者：Symposium on Logic in Computer Science (15th : 2000 : Santa Barbara、 Calif.)、IEEE Xplore (Online service)、IEEE Computer Society. Technical Committee on Mathematical Foundations of Computing.、出版社：Los Alamitos, Calif. : IEEE Computer Society, c2000.		Testing object-oriented software : lifecycle solutions 0 索取号：TP311.5/E20012 作者：Bashir、 Imran.、Goel、 Amrit L.、出版社：New York : Springer, c1999.
	Advances in semiconductor lasers and applications to optoelectronics 0 索取号：TN248.4/E20011 作者：出版社：Singapore ; New Jersey : World Scientific, c2000		Testing IT : an off-the-shelf software testing process 0 索取号：TP311.5/E20017 作者：Watkins、 John (John Edward)、出版社：Cambridge, U.K. ; New York : CambridgeUniversity Press, 2001.

	Language testing 0 索取号：H31/E604 作者：出版社：[s.l : s.n.], 19-		Introductory steps to understanding 0 索取号：H31/E9035 作者：Hill、 L. A. (Leslie Alexander).、出版社：Tokyo : Oxford University Press, 1980.
	Studies in bilingual education 0 索取号：H09-53/E801 作者：Lord、 Robert、 1931-、Tsou、 Ka-yin、 Benjamin.、University of Hong Kong. Language Centre.、International Symposium on Bilingual Education (Hong Kong : 1976).、出版社：Hong Kong : Language Centre, University of Hong Kong, [1977?]		Testing English as a second language 0 索取号：H31/E708 作者：Harris、 David P. (David Payne)、 1925-、出版社：New York : McGraw-Hill, [1969].
	1998 Midwest Symposium on Circuits and Systems : proceedings, August 9-12, 1998, Notre Dame, Indiana 0 索取号：TN7-53/E20071/41 作者：Midwest Symposium on Circuits and Systems (40th : 1998 : Notre Dame、 Indiana)、IEEE Circuits and Systems Society.、出版社：Los Alamitos, CA : IEEE Computer Soicety, c1998.		Proceedings [of the] 42nd Midwest Symposium on Circuits and Systems [electronic resource] : Corbett Center, New Mexico State University, Las Cruces, New Mexico 0 索取号：TN7-53/E20071/42.2 作者：Midwest Symposium on Circuits and Systems (42nd : 1999 : Las Cruces、 N.M.)、Ramírez-Angulo、 Jaime.、IEEE Xplore (Online service)、IEEE Circuits and Systems Society.、出版社：[New York, N.Y.] : Institute of Electrical and Electronics Engineers ; Piscataway, N.J. : IEEE Service Center, c1999.
	Proceedings [of the] 42nd Midwest Symposium on Circuits and Systems [electronic resource] : Corbett Center, New Mexico State University, Las Cruces, New Mexico 0 索取号：TN7-53/E20071/42.1 作者：Midwest Symposium on Circuits and Systems (42nd : 1999 : Las Cruces、 N.M.)、Ramírez-Angulo、 Jaime.、IEEE Xplore (Online service)、IEEE Circuits and Systems Society.、出版社：[New York, N.Y.] : Institute of Electrical and Electronics Engineers ; Piscataway, N.J. : IEEE Service Center, c1999.		Language testing : a critical survey and practical guide 0 索取号：H09/E9020 作者：Baker、 David.、出版社：London : Edward Arnold, c1989.
	Fatigue and fracture mechanics : 30th volume 0 索取号：O346.1-532/E20011/30 作者：National Symposium on Fatigue and Fracture Mechanics (30th : 1998 : St. Louis、 Missouri)、Jerina、 Kenneth L.、Paris、 P. C. (Paul Croce)、 1930-、ASTM Committee E-8 on Fatigue and Fracture.、出版社：West Conshohocken, Pennsylvania : ASTM, c2000.		Ciba Foundation Symposium : Disorders of Language 0 索取号：H018.4/E701 作者：Symposium on Disorders of Language (1963 : London、 England)、De Reuck、 Anthony V. S.、Ciba Foundation.、O'Connor、 Maeve.、出版社：Boston : Little, Brown, 1964.
	Cliffs memory power for exams 0 索取号：G791/E901 作者：Browning、 William G.、出版社：Lincoln, Neb. : Cliffs Notes, c1983.		Medical physics : fourth Mexican symposium, Merida, Yucatan, Mexico, 1-4 March 2000 0 索取号：R-05/E20011/2000 作者：出版社：Melville, N.Y. : American Institute of Physics, 2000.
	Proceedings, 15th annual Symposium on Logic in Computer Science [electronic resource] : June 26-28, 2000, Santa Barbara, California 0 索取号：TP301-53/E991/15 作者：Symposium on Logic in Computer Science (15th : 2000 : Santa Barbara、 Calif.)、IEEE Xplore (Online service)、IEEE Computer Society. Technical Committee on Mathematical Foundations of Computing.、出版社：Los Alamitos, Calif. : IEEE Computer Society, c2000.		Testing object-oriented software : lifecycle solutions 0 索取号：TP311.5/E20012 作者：Bashir、 Imran.、Goel、 Amrit L.、出版社：New York : Springer, c1999.
	Advances in semiconductor lasers and applications to optoelectronics 0 索取号：TN248.4/E20011 作者：出版社：Singapore ; New Jersey : World Scientific, c2000		Testing IT : an off-the-shelf software testing process 0 索取号：TP311.5/E20017 作者：Watkins、 John (John Edward)、出版社：Cambridge, U.K. ; New York : CambridgeUniversity Press, 2001.